TY - JOUR T1 - Competing reversal mechanisms and edge roughness in thin micron-scale ferromagnetic ring elements JO - INTERMAG 2006 - IEEE International Magnetics Conference PY - 2006/01/01 AU - Hayward TJ AU - Van Belle F AU - Bland J ED - DO - DOI: 10.1109/INTMAG.2006.374971 SP - 940 Y2 - 2025/06/24 ER -