TY - JOUR T1 - Temperature dependence of impact ionization in submicrometer silicon devices JO - IEEE Transactions on Electron Devices PY - 2006/01/01 AU - Massey DJ AU - David JPR AU - Rees GJ ED - DO - DOI: 10.1109/TED.2006.881010 VL - 53 IS - 9 SP - 2328 EP - 2334 Y2 - 2025/06/24 ER -