TY - CHAP T1 - Characterization of InGaAs (N)/GaAsN multi-quantum wells using transmission electron microscopy T2 - Microscopy of Semiconducting Materials 2003 UR - http://dx.doi.org/10.1201/9781351074636-33 PY - 2018/01/10 AU - Guti茅rrez M AU - Herrera M AU - Ross I AU - Gonz谩lez D AU - Hopkinson M AU - Garc铆a R ED - DO - DOI: 10.1201/9781351074636-33 PB - CRC Press SP - 143 EP - 146 Y2 - 2025/06/23 ER -