TY - CHAP T1 - Universal Relation Between Avalanche Breakdown Voltage and Bandstructure in Wide-Gap Semiconductors T2 - Hot Carriers in Semiconductors PY - 1996/02/06 AU - Allam J AU - David JPR ED - DO - DOI: 10.1007/978-1-4613-0401-2_78 PB - Springer US SN - 9781461380351 SP - 343 EP - 346 Y2 - 2025/05/25 ER -