TY - JOUR T1 - Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high-voltage atomic resolution microscope JO - J ELECTRON MICROSC PY - 1997/01/01 AU - Mobus G AU - Phillipp F AU - Gemming T AU - Schweinfest R AU - Ruhle M ED - VL - 46 IS - 5 SP - 381 EP - 395 Y2 - 2025/06/29 ER -