TY - CONF T1 - Impact of oxide degradation on universal mobility behaviour of n-MOS inversion layers JO - PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS PY - 2002/01/01 AU - Manhas SK AU - De Souza MM AU - Oates AS AU - Chen Y ED - DO - DOI: 10.1109/IPFA.2002.1025668 SP - 227 EP - 231 Y2 - 2025/05/20 ER -