TY - CONF T1 - Investigating the stability of thin film transistors with zinc oxide as the channel layer JO - 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL PY - 2007/01/01 AU - Cross RBM AU - De Souza MM AU - IEEE ED - DO - DOI: 10.1109/RELPHY.2007.369935 SN - 978-1-4244-0918-1 SP - 467 EP - + Y2 - 2025/05/21 ER -