TY - CONF T1 - Surveying the Developer Experience of Flaky Tests JO - 2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP) UR - http://dx.doi.org/10.1109/icse-seip55303.2022.9793965 PY - 2022/01/01 AU - Parry O AU - Kapfhammer GM AU - Hilton M AU - McMinn P ED - DO - DOI: 10.1109/icse-seip55303.2022.9793965 PB - IEEE Y2 - 2025/06/30 ER -