TY - JOUR
T1 - Carrier Escape and the Ideality Factor in Quantum Dot p-n Junctions
JO - IEEE JOURNAL OF QUANTUM ELECTRONICS
PY - 2014/04/01
AU - Spencer P
AU - Clarke E
AU - Murray R
ED -
DO - DOI: 10.1109/JQE.2014.2303515
VL - 50
IS - 4
SP - 213
EP - 219
Y2 - 2025/05/23
ER -