@article{article, title = {{Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy}}, publisher = {{Wiley}}, url = {{http://eprints.whiterose.ac.uk/91479/ }}, year = {{2014}}, month = {{7}}, author = {{Walther T and Richards RD and Bastiman F}}, doi = {{10.1002/crat.201400157}}, volume = {{50}}, journal = {{Crystal Research and Technology}}, issue = {{1}}, pages = {{38-42}}, note = {{Accessed on 2025/06/29}}}