TY  - JOUR

T1  - High Risk Regional Load Attacks in Smart Grids

JO  - IEEE Internet of Things Journal

UR  - https://doi.org/10.1109/jiot.2025.3564490

PY  - 2025/04/25

AU  - Du M

AU  - Zhang X

AU  - Zhao J

ED  - 

DO  - DOI: 10.1109/jiot.2025.3564490

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SP  - 1

EP  - 1

Y2  - 2025/04/30

ER  -