TY - JOUR T1 - Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging JO - Advanced Materials UR - http://eprints.whiterose.ac.uk/122497/ PY - 2017/12/14 AU - Wan Q AU - Abrams K AU - Masters R AU - Talari AU - Rehman AU - Claeyssens AU - Holland C AU - Rodenburg C ED - DO - DOI: 10.1002/adma.201703510 PB - Wiley VL - 29 IS - 47 Y2 - 2025/06/27 ER -