TY - CONF T1 - Degradation behaviour of polysilicon high voltage thin film transistors JO - Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) PY - 2002/01/01 AU - Mugnier M AU - Manhas SK AU - Chandra Sekhar D AU - Krishnan S AU - Cross R AU - Sankara Narayanan EM AU - De Souza MM AU - Flores D AU - Vellvehi M AU - Millan J ED - DO - DOI: 10.1109/ipfa.2002.1025666 PB - IEEE Y2 - 2025/06/23 ER -