TY - CONF T1 - Application of a new method for measuring small amounts of dopants at planar faults: tin-rich inversion boundaries in zinc oxide CY - Herentals PY - 2004/01/01 AU - Daneu N AU - Walther T AU - Recnik A ED - Schryvers D ED - Timmermans J-P PB - Belgian Society for Microscopy, Liege VL - 3 SP - 63 EP - 64 Y2 - 2025/05/22 ER -