@inproceedings{inproceedings, title = {{Failure analysis studies in pseudomorphic SiGe channel p-MOSFET devices}},
url = {{}},
year = {{2005}},
month = {{1}},
author = {{Chang ACK and Ross IM and Norris DJ and Cullis AG and T Tang Y and Cerrina C and Evans AGR}},
volume = {{107}},
journal = {{Microscopy of Semiconducting Materials}},
pages = {{413-416}},
note = {{Accessed on 2025/07/04}}}