TY - CONF T1 - High-k gate dielectric MOSFETs: Meeting the challenges of characterization and modeling JO - ECS Transactions PY - 2011/01/01 AU - De Souza MM AU - Sicre SBF AU - Casterman D ED - DO - DOI: 10.1149/1.3572305 SN - 9781566778657 VL - 35 IS - 4 SP - 563 EP - 580 Y2 - 2025/05/26 ER -