TY - JOUR T1 - A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy JO - Review of Scientific Instruments UR - http://eprints.whiterose.ac.uk/106359/ PY - 2014/11/01 AU - Mullin N AU - Hobbs JK ED - DO - DOI: 10.1063/1.4901221 VL - 85 IS - 11 Y2 - 2025/06/23 ER -