TY - JOUR T1 - Correlation between defect density and current leakage in InAs/GaAs quantum dot-in-well structures JO - J APPL PHYS PY - 2009/07/15 AU - Sanchez AM AU - Beanland R AU - Hasbullah NF AU - Hopkinson M AU - David JPR ED - DO - DOI: 10.1063/1.3168492 VL - 106 IS - 2 Y2 - 2025/05/20 ER -